Standard

 

ELC 258 – Advanced Electronic Troubleshooting

Course Description

Develops techniques in troubleshooting and repairing electronic systems at the component level.  Emphasis is placed on developing a logical approach to problem solving, the utilization of common and specialized test equipment, and providing experience in troubleshooting various kinds of electronic systems.  Topics include:  system analysis techniques, analog circuit analysis and troubleshooting, digital circuit analysis and troubleshooting, and use of specialized test equipment and procedures.

 

Competency Areas

Hours

 

System Analysis Techniques

Class

2

Analog Circuit Analysis and Troubleshooting

D. Lab

8

Digital Circuit Analysis and Troubleshooting     

P. Lab/O.B.I.

0

Use of Specialized Test Equipment and Procedures.

Credit

6

Prerequisite/Corequisite:

ELC 140

 

Course Guide

 

Competency

After completing this section, the student will:

Hours

Class

D.Lab

P.Lab/

O.B.I.

SYSTEM ANALYSIS TECHNIQUES

5

15

0

System operation

Describe the functional operation of an electronic system.

 

 

 

Operation of major sections

Describe the functional operation of each major section of an electronic system.

 

 

 

Waveform characteristics

Describe the normal input/output waveform characteristics for each section.

 

 

 

Fault isolation

Use circuit tracing techniques to determine which section/component is not operating correctly.

 

 

 

Substitution procedures

Discuss the references to consult when determining part substitution for circuit repair.

 

 

 

Remove and replace procedures

Describe the procedures for removing and replacing a faulty component in an electronic system.

 

 

 

 

Remove and replace a faulty component in an electronic system.

 

 

 

Final system operational check

Perform a system operational check to verify effective repair has been completed.

 

 

 

ANALOG CIRCUIT ANALYSIS AND TROUBLESHOOTING

5

25

0

Locating an inoperative stage/section

Use schematics to identify the stage/section of an inoperative analog circuit.

 

 

 

Signal comparisons

Compare test input/output level with normal input/output level for stage/section of an analog system.

 

 

 

Locating defective component

Use test equipment and/or substitution boxes to determine exact location of inoperative analog stage/section or component.

 

 

 

Remove and replace

Follow appropriate maintenance procedures to remove and replace a defective component from an analog circuit.

 

 

 

Verify operational condition

Assemble and test align repaired analog circuit to assure operation meets minimum performance standards.

 

 

 

DIGITAL CIRCUIT ANALYSIS AND TROUBLESHOOTING

5

25

0

Locating an inoperative stage/section

Use schematics to identify the stage/section of an inoperative digital circuit.

 

 

 

Signal comparisons

Compare test input/output level with normal input/output level for stage/section of a digital system.

 

 

 

Locating defective component

Use test equipment and/or substitution boxes to determine exact location of inoperative digital stage/section or component.

 

 

 

Remove and replace

Follow appropriate maintenance procedures to remove and replace a defective component from a digital circuit.

 

 

 

Verify operational condition

Assemble and test align repaired digital circuit to assure operation meets minimum performance standards.

 

 

 

USE OF SPECIALIZED TEST EQUIPMENT AND PROCEDURES

5

15

0

Static stimulus testing

Describe the test equipment used to perform a static stimulus test on an electronic system.

 

 

 

 

Use test equipment to perform a static stimulus test on an electronic system.

 

 

 

 

Discuss the advantages and disadvantages of the static stimulus test procedure when analyzing electronic system operation.

 

 

 

Signal injection

Describe the test equipment used to perform a signal injection on an electronic system.

 

 

 

 

Use test equipment to perform a signal injection on an electronic system.

 

 

 

 

Discuss the advantages and disadvantages of the signal injection procedure when analyzing electronic system operation.

 

 

 

Trends in troubleshooting electronic systems

Discuss the trends in test equipment used to operationally test electronic systems.

 

 

 

 

Discuss trends in built-in circuit diagnosis features of electronic systems.

 

 

 

 

Discuss resources technicians consult to remain current on trends in troubleshooting electronic systems.

 

 

 

 

Suggested Resources

 

Books

 

Bechtel.  (1995).  Digital electronics.  Englewood Cliffs, NJ: Prentice Hall.

Bogart, T. F.  (1992).  Introduction to digital circuits.  Columbus, OH: Macmillan.

Floyd, T. L.  (1993).  Digital fundamentals (5th ed.).  New York: Macmillan.

Frenzel.  (1995).  Digital electronics: Principles & practice.  Albany, NY: Delmar.

Goldberg, J.  (1994).  Troubleshooting electronic devices.  Albany, NY: Delmar.

Heath Company.  (1993).  Digital techniques.  Atlanta: Technical Training Aids.

Kleitz, W.  (1995).  Digital electronics: A practical approach (4th ed.).  Englewood Cliffs, NJ: Prentice Hall.

Lab-Volt Systems.  (1993).  Digital logic/fundamentals.  Farmingdale, NJ: Author.

Reis, R. A.  (1990).  Digital electronics through project analysis.  New York: Macmillan.

Tocci, R. J., & Widner, N. S.  (1994).  Digital systems: Principles and applications (6th ed.).  Englewood Cliffs, NJ: Prentice Hall.

Tokheim, R. L.  (1994).  Digital electronics (4th ed.).  Columbus, OH: McGraw-Hill.

 

Computer-Based Instruction

 

Heath Company.  (1993).  Digital trainer.  Atlanta: Technical Training Aids.

Lab-Volt Systems.  (1993).  Digital logic/fundamentals.  Farmingdale, NJ: Author.

 

Training Aids

 

Heath Company.  (1993).  Digital trainer.  Atlanta: Technical Training Aids.

Lab-Volt Systems.  (1993).  Digital trainers, model 91000 series.  Farmingdale, NJ: Author.